Location	Techniques	More information
University of Bath	Advanced electron-beam lithography system (Hitachi S-4300 scanning electron Microscope & Raith ElphyPlus professional lithography attachment) and supporting processes including thin film deposition and wet/dry etching facilities.	Dr Spartaco Landi  Website
Cardiff University	X-ray photoelectron spectroscopy analysis centre. The Kratos Axis Ultra-DLD system combines x-ray photoelectron spectroscopy (XPS), micro XPS and imaging XPS.	Dr Albert Carley Website
University of Nottingham	Coordinated open-access centre offering a range of techniques for comprehensive materials analysis: Dual-beam focussed ion beam scanning electron microscopy (FIB-SEM) Field emission gun transmission electron microscopy (FEG-TEM) Environmental scanning electron microscopy (ESEM) X-ray photoelectron spectroscopy (XPS) Time-of-flight secondary ionisation mass spectrometry (ToF-SIMS) Electron probe microanalysis	Dr Peter Milligan Website
University of Oxford	High resolution transmission electron microscopy facilities available from 1 January 2008. Instruments include: JEOL 2200FS 3000F 4000EX(HREM) 4000EX-SE	Dr Crispin Hetherington Website
Queen Mary, University of London	Environmental scanning electron microscope (SEM) available from February 2008.	Dr Asa Barber  Dr Andy Bushby  Website
University of St Andrews	School of Chemistry electron microscope facility: Jeol JEM 2011 high resolution transmission electron microscopes (HRTEM) Jeol JSM 5600 scanning electron microscope (SEM)	Dr Wuzong Zhou  Website
University College London	‘Triple-beam’ focussed ion-beam (FIB) microscope at the London Centre for Nanotechnology.	Dr Paul Warburton Website

Access to Materials Equipment

The new services were awarded grants by EPSRC as part our activity on improving access to materials research equipment. We have also developed a database to help researchers to share their equipment.

More information:

• Materials equipment
  Background, database, facilities, services